| SI.No | Title | Division | Facility/Equipment | Method/Instrument | Charges for R&D Instt & SSI | Charges for Students | Charges for Industry | Charges for Internal Samples | Remark | Remark2 |
|---|---|---|---|---|---|---|---|---|---|---|
| 41 | 2D - X-ray Diffraction (2D XRD) | Materials Science & Technology Division (MSTD) | 2D - X-ray Diffraction (2D XRD) | Xenocs, Xeuss SAXS/ WAXS | 3750 | 2500 | 7500 | Per sample |
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| 42 | Scanning Electron Microscopy (SEM) | Materials Science & Technology Division (MSTD) | Scanning Electron Microscopy (SEM) | Scanning Electron Microscopy (SEM) | 4500 | 2250 | 9000 | Per sample |
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| 43 | SEM-EDS Two frame analysis | Materials Science & Technology Division (MSTD) | SEM-EDS Two frame analysis | 4500 | 2250 | 9000 | Per sample |
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| 44 | SEM-EDS With X-ray dot mapping | Materials Science & Technology Division (MSTD) | SEM-EDS With X-ray dot mapping | SEM-EDS With X-ray dot mapping | 10800 | 5400 | 21600 | Per sample |
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| 45 | PPMS Vibrating Sample Magnetometry (VSM)Testing Charges /Hour | Materials Science & Technology Division (MSTD) | PPMS Vibrating Sample Magnetometry (VSM)Testing Charges /Hour | PPMS Vibrating Sample Magnetometry (VSM)Testing Charges /Hour | 3000 | 1500 | 6000 | Per sample |
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| 46 | PPMS Thermal Transport Option (TTO) Testing Charges /Hour | Materials Science & Technology Division (MSTD) | PPMS Thermal Transport Option (TTO) Testing Charges /Hour | PPMS Thermal Transport Option (TTO) Testing Charges /Hour | 4000 | 2000 | 8000 | Per Hour |
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| 47 | Thermal Conductivity Testing(Xe-Flash Technique) | Materials Science & Technology Division (MSTD) | Thermal Conductivity Testing(Xe-Flash Technique) | Thermal Conductivity Testing(Xe-Flash Technique) | 3750 | 2400 | 7500 | Per sample |
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| 48 | Dilatometry (Thermal Expansivity) | Materials Science & Technology Division (MSTD) | Dilatometry (Thermal Expansivity) | Dilatometry (Thermal Expansivity) | 2250 | 1500 | 4500 | Per sample |
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| 49 | Thermomechanical Analyzer (Hitachi) | Materials Science & Technology Division (MSTD) | Thermomechanical Analyzer (Hitachi) | Thermomechanical Analyzer (Hitachi) | 2500 | 1250 | 5000 | Per sample |
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| 50 | Thermal Conductivity Testing (Xe-Flash Technique) | Materials Science & Technology Division (MSTD) | Thermal Conductivity Testing (Xe-Flash Technique) | Thermal Conductivity Testing (Xe-Flash Technique) | 3750 | 2400 | 7500 | Per sample |
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| 51 | EMI Shielding and Microwave Dielectric Testing | Materials Science & Technology Division (MSTD) | EMI Shielding and Microwave Dielectric Testing | EMI Shielding and Microwave Dielectric Testing | 3000 | 1500 | 6000 | Per sample |
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| 52 | Screen and Stencil Printing (without consumables like patterned screen, conductive ink etc) | Materials Science & Technology Division (MSTD) | Screen and Stencil Printing (without consumables like patterned screen, conductive ink etc) | Screen and Stencil Printing (without consumables like patterned screen, conductive ink etc) | 4000 | 2500 | 8000 | Per sample |
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| 53 | Screen and Stencil Printing (consumables like patterned screen, conductive ink, cleaning solution etc. should be provided by the user) | Materials Science & Technology Division (MSTD) | Screen and Stencil Printing (consumables like patterned screen, conductive ink, cleaning solution etc. should be provided by the user) | Screen and Stencil Printing (consumables like patterned screen, conductive ink, cleaning solution etc. should be provided by the user) | 1000 | 500 | 2000 | Per sample |
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| 54 | Isostatic Lamination Pressing | Materials Science & Technology Division (MSTD) | Isostatic Lamination Pressing | 2000 | 1000 | 4000 | Per sample |
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| 55 | Ferroelectric P-E Measurement | Materials Science & Technology Division (MSTD) | Ferroelectric P-E Measurement | 3000 | 1500 | 6000 | Per sample |
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| 56 | RF Dielectric Measurement | Materials Science & Technology Division (MSTD) | RF Dielectric Measurement | 2000 | 1000 | 4000 | Per sample |
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| 57 | Particle size analyser | Materials Science & Technology Division (MSTD) | Particle size analyser | 480 | 320 | 960 | Per sample |
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| 58 | Zeta Potential Analyser | Materials Science & Technology Division (MSTD) | Zeta Potential Analyser | 480 | 320 | 960 | Per sample |
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| 59 | Rheometer | Materials Science & Technology Division (MSTD) | Rheometer | 2040 | 1360 | 4080 | Per programme |
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| 60 | Differential Scanning Calorimetry (DSC) | Materials Science & Technology Division (MSTD) | Differential Scanning Calorimetry (DSC) | 3240 | 2000 | 6480 | Per sample |
Analytical Testing & Services Coordinator's Address
Mr. Chandrakanth CK,
Sr.Principal Scientist,
Analytical Testing and Services Coordinator,
CSIR-NIIST, pappanamcode, Thiruvananthapuram - 695019,
Telephone. : +91-471-2515226 E-Mail: chandra[at]niist[dot]res[dot]in )
